IEEE Transactions on Device and Materials Reliability (ERA Journal)

IEEE Transactions on Device and Materials Reliability is an ERA accredited research journal used as part of the evaluation of the ERA research rankings.

IEEE Transactions on Device and Materials Reliability issn is: 1530-4388.

The field covered by IEEE Transactions on Device and Materials Reliability as part of the evaluation of Australian university research excellence is:

Electrical and Electronic Engineering Research Rankings (Sub-Field)

Other ERA-accredited journals supporting the evaluation of the Electrical and Electronic Engineering field include:

- Applied Computational Electromagnetics Society Newsletter
- Assembly Automation: the international journal of assembly technology and management
- Computers and Electrical Engineering
- Electronic Materials Letters
- IEEE Transactions on Energy Conversion
- IEEE Transactions on NanoBioscience
- IEEE Transactions on Nanotechnology
- IEEE Transactions on Software Engineering
- International Journal of Industrial Electronics and Drives
- International Journal of Power Electronics
- Iranian Journal of Electrical and Computer Engineering
- Optica
- Russian Electrical Engineering
- Semiconductor Science and Technology
- Tohoku Daigaku Dentsu Danwakai Kiroku

ERA Research Rankings Submenu

- ERA 2018 Outcomes Research Rankings List

- ERA 2018 Research Rankings Analysis

- ERA 2018 Individual University Outcomes List

- ERA List of Research Fields Rankings

- ERA Journal Rankings 2018 List

Latest News and Updates:

- Top 10 Best Australian Universities

- Gender Balance Male-Female Ratio

- ERA 2018 Outcomes Research Rankings List

- University Bachelor Degree Completion Rates

- QS Employability Rankings Australian Universities

- ARWU World Rankings of Australian Universities

- Group of Eight (go8) World Rankings

Share This Page