Microelectronics Reliability (ERA Journal)

Microelectronics Reliability is an ERA accredited research journal used as part of the evaluation of the ERA research rankings.

Microelectronics Reliability issns are issn1: 0026-2714 issn2: 1872-941X.

The field covered by Microelectronics Reliability as part of the evaluation of Australian university research excellence is:

Electrical and Electronic Engineering Research Rankings (Sub-Field)

Other ERA-accredited journals supporting the evaluation of the Electrical and Electronic Engineering field include:

- Archives of Electrical Engineering
- Automation and Remote Control
- IEEE Journal of Oceanic Engineering
- IEEE Transactions on Biomedical Engineering
- IEEE Transactions on Electromagnetic Compatibility
- IEEE Transactions on Evolutionary Computation
- IEEE Transactions on Transportation Electrification
- IET Image Processing
- International Journal of Control
- Journal of Chemistry and Chemical Engineering
- Journal of Micro/Nanolithography MEMS and MOEMS
- Journal of Semiconductors
- Journal of the Optical Society of America A: Optics Image Science and Vision
- Optica
- Progress in Electromagnetics Research Letters

ERA Research Rankings Submenu

- ERA 2018 Outcomes Research Rankings List

- ERA 2018 Research Rankings Analysis

- ERA 2018 Individual University Outcomes List

- ERA List of Research Fields Rankings

- ERA Journal Rankings 2018 List

Latest News and Updates:

- Top 10 Best Australian Universities

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- ERA 2018 Outcomes Research Rankings List

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- QS Employability Rankings Australian Universities

- ARWU World Rankings of Australian Universities

- Group of Eight (go8) World Rankings

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